Efficient sensitivity based capacitance modeling for systematic and random geometric variations

Y Bi; P Harpe; NP van der Meijs

doi:10.1109/ASPDAC.2011.5722262

Efficient sensitivity based capacitance modeling for systematic and random geometric variations

Signal Processing Systems

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

4 Citations (Scopus)

Original language	English
Title of host publication	Proceedings IEEE 16th Asia and South Pacific Design Automation Conference
Editors	K Asada
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	61-66
Number of pages	6
ISBN (Print)	978-1-4244-7516-2
DOIs	https://doi.org/10.1109/ASPDAC.2011.5722262
Publication status	Published - 2011
Event	ASP-DAC, Yokohama, Japan - Piscataway, NJ, USA Duration: 25 Jan 2011 → 28 Jan 2011

Publication series

Name
Publisher	IEEE

Conference

Conference	ASP-DAC, Yokohama, Japan
Period	25/01/11 → 28/01/11

Keywords

Conf.proc. > 3 pag

Access to Document

10.1109/ASPDAC.2011.5722262

Cite this

@inproceedings{5cc3b2c278684c9ab7f1924bc452ae1c,

title = "Efficient sensitivity based capacitance modeling for systematic and random geometric variations",

keywords = "Conf.proc. > 3 pag",

author = "Y Bi and P Harpe and {van der Meijs}, NP",

year = "2011",

doi = "10.1109/ASPDAC.2011.5722262",

language = "English",

isbn = "978-1-4244-7516-2",

publisher = "IEEE Society",

pages = "61--66",

editor = "K Asada",

booktitle = "Proceedings IEEE 16th Asia and South Pacific Design Automation Conference",

note = "ASP-DAC, Yokohama, Japan ; Conference date: 25-01-2011 Through 28-01-2011",

}

Efficient sensitivity based capacitance modeling for systematic and random geometric variations. / Bi, Y; Harpe, P; van der Meijs, NP.
Proceedings IEEE 16th Asia and South Pacific Design Automation Conference. ed. / K Asada. Piscataway, NJ, USA: IEEE Society, 2011. p. 61-66.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Efficient sensitivity based capacitance modeling for systematic and random geometric variations

AU - Bi, Y

AU - Harpe, P

AU - van der Meijs, NP

PY - 2011

Y1 - 2011

KW - Conf.proc. > 3 pag

U2 - 10.1109/ASPDAC.2011.5722262

DO - 10.1109/ASPDAC.2011.5722262

M3 - Conference contribution

SN - 978-1-4244-7516-2

SP - 61

EP - 66

BT - Proceedings IEEE 16th Asia and South Pacific Design Automation Conference

A2 - Asada, K

PB - IEEE Society

CY - Piscataway, NJ, USA

T2 - ASP-DAC, Yokohama, Japan

Y2 - 25 January 2011 through 28 January 2011

ER -