@inproceedings{5cc3b2c278684c9ab7f1924bc452ae1c,
title = "Efficient sensitivity based capacitance modeling for systematic and random geometric variations",
keywords = "Conf.proc. > 3 pag",
author = "Y Bi and P Harpe and {van der Meijs}, NP",
year = "2011",
doi = "10.1109/ASPDAC.2011.5722262",
language = "English",
isbn = "978-1-4244-7516-2",
publisher = "IEEE",
pages = "61--66",
editor = "K Asada",
booktitle = "Proceedings IEEE 16th Asia and South Pacific Design Automation Conference",
address = "United States",
note = "ASP-DAC, Yokohama, Japan ; Conference date: 25-01-2011 Through 28-01-2011",
}