@inproceedings{325a79d43d854d0499cf7d75ef6aee44,
title = "Efficient tests and DFT for RAM address decoder delay faults",
keywords = "Elektrotechniek, Techniek, conference contrib. refereed, Conf.proc. > 3 pag",
author = "S Hamdioui and Z Al-Ars",
note = "neo; IDT2008 ; Conference date: 20-12-2008 Through 22-12-2008",
year = "2008",
language = "Undefined/Unknown",
isbn = "978-1-4244-3477-0",
publisher = "IEEE Society",
pages = "225--230",
editor = "s.n.",
booktitle = "3rd International Design and Test workshop",
}