Efficient tests for realistic faults in dual-port SRAMS

S Hamdioui, AJ van de Goor

Research output: Contribution to journalArticleScientificpeer-review

25 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)460-474
Number of pages15
JournalIEEE Transactions on Computers
Volume51
Issue number5
Publication statusPublished - 2002

Keywords

  • Elektrotechniek
  • Techniek
  • ZX Nader te bep. ivm conversie

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