Efficient tests for realistic faults in dual-port SRAMS

S Hamdioui, AJ van de Goor

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	460-474
Number of pages	15
Journal	IEEE Transactions on Computers
Volume	51
Issue number	5
Publication status	Published - 2002

Keywords

@article{7dc09539cae64272b2807a829e97d6f3,

title = "Efficient tests for realistic faults in dual-port SRAMS",

keywords = "Elektrotechniek, Techniek, ZX Nader te bep. ivm conversie",

author = "S Hamdioui and {van de Goor}, AJ",

year = "2002",

language = "Undefined/Unknown",

volume = "51",

pages = "460--474",

journal = "IEEE Transactions on Computers",

issn = "0018-9340",

publisher = "IEEE",

number = "5",

}