Electrical characterisation of low temperature aligned carbon nanotubes for vertical interconnects

S Vollebregt; R Ishihara; J van der Cingel; H Schellevis; CIM Beenakker

Electrical characterisation of low temperature aligned carbon nanotubes for vertical interconnects

S Vollebregt, R Ishihara, J van der Cingel, H Schellevis, CIM Beenakker

Electronic Components, Technology and Materials

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	ICT.OPEN: Micro technology and micro devices (SAFE 2011)
Editors	A Smeulders, R van der Drift, F Karelse, D Stroobandt
Place of Publication	Veldhoven, The Netherlands
Publisher	STW
Pages	1-1
Number of pages	1
Publication status	Published - 2011
Event	ICT.OPEN 2011 - Veldhoven, The Netherlands Duration: 14 Nov 2011 → 15 Nov 2011

Publication series

Name
Publisher	STW

Conference

Conference	ICT.OPEN 2011
Period	14/11/11 → 15/11/11

Keywords

Geen BTA classificatie

Cite this

@inproceedings{0ee08e88a1c949f2a6cfd1536a29aa10,

title = "Electrical characterisation of low temperature aligned carbon nanotubes for vertical interconnects",

keywords = "Geen BTA classificatie",

author = "S Vollebregt and R Ishihara and {van der Cingel}, J and H Schellevis and CIM Beenakker",

year = "2011",

language = "English",

publisher = "STW",

pages = "1--1",

editor = "A Smeulders and {van der Drift}, R and F Karelse and D Stroobandt",

booktitle = "ICT.OPEN: Micro technology and micro devices (SAFE 2011)",

note = "ICT.OPEN 2011 ; Conference date: 14-11-2011 Through 15-11-2011",

}

Vollebregt, S , Ishihara, R , van der Cingel, J , Schellevis, H & Beenakker, CIM 2011, Electrical characterisation of low temperature aligned carbon nanotubes for vertical interconnects. in A Smeulders, R van der Drift, F Karelse & D Stroobandt (eds), ICT.OPEN: Micro technology and micro devices (SAFE 2011). STW, Veldhoven, The Netherlands, pp. 1-1, ICT.OPEN 2011, 14/11/11.

Electrical characterisation of low temperature aligned carbon nanotubes for vertical interconnects. / Vollebregt, S ; Ishihara, R ; van der Cingel, J et al.
ICT.OPEN: Micro technology and micro devices (SAFE 2011). ed. / A Smeulders; R van der Drift; F Karelse; D Stroobandt. Veldhoven, The Netherlands: STW, 2011. p. 1-1.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Electrical characterisation of low temperature aligned carbon nanotubes for vertical interconnects

AU - Vollebregt, S

AU - Ishihara, R

AU - van der Cingel, J

AU - Schellevis, H

AU - Beenakker, CIM

PY - 2011

Y1 - 2011

KW - Geen BTA classificatie

M3 - Conference contribution

SP - 1

EP - 1

BT - ICT.OPEN: Micro technology and micro devices (SAFE 2011)

A2 - Smeulders, A

A2 - van der Drift, R

A2 - Karelse, F

A2 - Stroobandt, D

PB - STW

CY - Veldhoven, The Netherlands

T2 - ICT.OPEN 2011

Y2 - 14 November 2011 through 15 November 2011

ER -