Electrical characterization of carbon nanotube vertical interconnects with different lengths and widths

S Vollebregt; R Ishihara; FD Tichelaar; J van der Cingel; CIM Beenakker

doi:10.1109/IITC.2012.6251578

Electrical characterization of carbon nanotube vertical interconnects with different lengths and widths

S Vollebregt, R Ishihara, FD Tichelaar, J van der Cingel, CIM Beenakker

Electronic Components, Technology and Materials

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

10 Citations (Scopus)

Original language	English
Title of host publication	2012 IEEE international interconnect technology conference (IITC 2012)
Editors	G Tech, A Naeemi
Place of Publication	Piscataway
Publisher	IEEE
Pages	1-3
Number of pages	3
DOIs	https://doi.org/10.1109/IITC.2012.6251578
Publication status	Published - 2012
Event	2012 IEEE international interconnect technology conference (IITC 2012), San Jose, California - Piscataway Duration: 4 Jun 2012 → 6 Jun 2012

Publication series

Name
Publisher	IEEE

Conference

Conference	2012 IEEE international interconnect technology conference (IITC 2012), San Jose, California
Period	4/06/12 → 6/06/12

Bibliographical note

Harvest
Article number: 6251578

Access to Document

10.1109/IITC.2012.6251578

Cite this

@inproceedings{3c57ffd31fda4cceb6a4f53b3ff1048c,

title = "Electrical characterization of carbon nanotube vertical interconnects with different lengths and widths",

author = "S Vollebregt and R Ishihara and FD Tichelaar and {van der Cingel}, J and CIM Beenakker",

note = "Harvest Article number: 6251578; 2012 IEEE international interconnect technology conference (IITC 2012), San Jose, California ; Conference date: 04-06-2012 Through 06-06-2012",

year = "2012",

doi = "10.1109/IITC.2012.6251578",

language = "English",

publisher = "IEEE",

pages = "1--3",

editor = "G Tech and A Naeemi",

booktitle = "2012 IEEE international interconnect technology conference (IITC 2012)",

address = "United States",

}

Vollebregt, S , Ishihara, R , Tichelaar, FD , van der Cingel, J & Beenakker, CIM 2012, Electrical characterization of carbon nanotube vertical interconnects with different lengths and widths. in G Tech & A Naeemi (eds), 2012 IEEE international interconnect technology conference (IITC 2012). IEEE, Piscataway, pp. 1-3, 2012 IEEE international interconnect technology conference (IITC 2012), San Jose, California, 4/06/12. https://doi.org/10.1109/IITC.2012.6251578

Electrical characterization of carbon nanotube vertical interconnects with different lengths and widths. / Vollebregt, S ; Ishihara, R ; Tichelaar, FD et al.
2012 IEEE international interconnect technology conference (IITC 2012). ed. / G Tech; A Naeemi. Piscataway: IEEE, 2012. p. 1-3.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Electrical characterization of carbon nanotube vertical interconnects with different lengths and widths

AU - Vollebregt, S

AU - Ishihara, R

AU - Tichelaar, FD

AU - van der Cingel, J

AU - Beenakker, CIM

N1 - Harvest Article number: 6251578

PY - 2012

Y1 - 2012

U2 - 10.1109/IITC.2012.6251578

DO - 10.1109/IITC.2012.6251578

M3 - Conference contribution

SP - 1

EP - 3

BT - 2012 IEEE international interconnect technology conference (IITC 2012)

A2 - Tech, G

A2 - Naeemi, A

PB - IEEE

CY - Piscataway

T2 - 2012 IEEE international interconnect technology conference (IITC 2012), San Jose, California

Y2 - 4 June 2012 through 6 June 2012

ER -