Electrical Characterization of Layer-Exchange Solid-Phase Epitaxy Si Junctions

Y Civale, R Mary-Joy, LK Nanver

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	SAFE 2007 Semiconductor advances for future electornics
Editors	s.n.
Place of Publication	s.l.
Publisher	STW
Pages	1-4
Number of pages	4
Publication status	Published - 2007

Name
Publisher	STW

Keywords

@inproceedings{3988409479714294855adc8a440055b3,

title = "Electrical Characterization of Layer-Exchange Solid-Phase Epitaxy Si Junctions",

keywords = "conference contrib. refereed, Vakpubl., Overig wet. > 3 pag",

author = "Y Civale and R Mary-Joy and LK Nanver",

year = "2007",

language = "Undefined/Unknown",

publisher = "STW",

pages = "1--4",

editor = "s.n.",

booktitle = "SAFE 2007 Semiconductor advances for future electornics",

}

TY - GEN

T1 - Electrical Characterization of Layer-Exchange Solid-Phase Epitaxy Si Junctions

AU - Civale, Y

AU - Mary-Joy, R

AU - Nanver, LK

PY - 2007

Y1 - 2007

KW - conference contrib. refereed

KW - Vakpubl., Overig wet. > 3 pag

M3 - Conference contribution

SP - 1

EP - 4

BT - SAFE 2007 Semiconductor advances for future electornics

A2 - s.n., null

PB - STW

CY - s.l.

ER -