Electrical characterization of wetted substrates

BP Iliev; MD Verweij; ZY Chang; GCM Meijer

Electrical characterization of wetted substrates

BP Iliev, MD Verweij, ZY Chang, GCM Meijer

Electronic Instrumentation

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	SAFE & ProRISC 2004; Proceedings of semiconductor advances for future electronics
Place of Publication	Utrecht
Publisher	STW Technology Foundation
Pages	1-4
Number of pages	4
ISBN (Print)	90-73461-43X
Publication status	Published - 2004
Event	Semiconductor advances for future electronics, Veldhoven, The Netherlands - Utrecht Duration: 25 Nov 2004 → 26 Nov 2004

Publication series

Name
Publisher	STW Technology Foundation

Conference

Conference	Semiconductor advances for future electronics, Veldhoven, The Netherlands
Period	25/11/04 → 26/11/04

Bibliographical note

ed. is niet bekend

Keywords

Vakpubl., Overig wet. > 3 pag

Cite this

@inproceedings{09dcb9aaa96a4f04b679e224b65b2df8,

title = "Electrical characterization of wetted substrates",

keywords = "Vakpubl., Overig wet. > 3 pag",

author = "BP Iliev and MD Verweij and ZY Chang and GCM Meijer",

note = "ed. is niet bekend; Semiconductor advances for future electronics, Veldhoven, The Netherlands ; Conference date: 25-11-2004 Through 26-11-2004",

year = "2004",

language = "Undefined/Unknown",

isbn = "90-73461-43X",

publisher = "STW Technology Foundation",

pages = "1--4",

booktitle = "SAFE & ProRISC 2004; Proceedings of semiconductor advances for future electronics",

}

TY - GEN

T1 - Electrical characterization of wetted substrates

AU - Iliev, BP

AU - Verweij, MD

AU - Chang, ZY

AU - Meijer, GCM

N1 - ed. is niet bekend

PY - 2004

Y1 - 2004

KW - Vakpubl., Overig wet. > 3 pag

M3 - Conference contribution

SN - 90-73461-43X

SP - 1

EP - 4

BT - SAFE & ProRISC 2004; Proceedings of semiconductor advances for future electronics

PB - STW Technology Foundation

CY - Utrecht

T2 - Semiconductor advances for future electronics, Veldhoven, The Netherlands

Y2 - 25 November 2004 through 26 November 2004

ER -