Electrical conductance of reconstructed sillicon surfaces

K Yoo, HH Weitering

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	115424-1-115424-11
Journal	Physical Review B (Condensed Matter and Materials Physics)
Volume	65
Issue number	11
Publication status	Published - 2002

Keywords

@article{d935e01ccbf94f6aa1e5cd4c6edbc1e0,

title = "Electrical conductance of reconstructed sillicon surfaces",

keywords = "academic journal papers, ZX CWTS 1.00 <= JFIS < 3.00",

author = "K Yoo and HH Weitering",

year = "2002",

language = "Undefined/Unknown",

volume = "65",

pages = "115424--1--115424--11",

journal = "Physical Review B (Condensed Matter and Materials Physics)",

issn = "1098-0121",

publisher = "American Physical Society",

number = "11",

}

TY - JOUR

T1 - Electrical conductance of reconstructed sillicon surfaces

AU - Yoo, K

AU - Weitering, HH

PY - 2002

Y1 - 2002

KW - academic journal papers

KW - ZX CWTS 1.00 <= JFIS < 3.00

M3 - Article

SN - 1098-0121

VL - 65

SP - 115424-1-115424-11

JO - Physical Review B (Condensed Matter and Materials Physics)

JF - Physical Review B (Condensed Matter and Materials Physics)

IS - 11

ER -