Electrical properties tomography using contrast source inversion techniques

R.F. Remis, A. Webb, S. Mandija, R.L. Leijsen, P.S. Fuchs, P.R.S. Stijnman, C.A.T. van den Berg

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

1 Citation (Scopus)

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