Electrical transport mechanisms in amorphous/crystalline silicon heterojunction: Impact of passivation layer thickness

M Mikolá¿ek, M Nemec, M Vojs, V Jakabovi¿, V ¿ehá¿ek, D Zhang, M Zeman, L Harmatha

Research output: Contribution to journalArticleScientificpeer-review

10 Citations (Scopus)
Original languageEnglish
Pages (from-to)315-319
Number of pages5
JournalThin Solid Films
Volume558
Issue numberMay
DOIs
Publication statusPublished - 2014

Bibliographical note

Harvest
Available online 26-2-2014

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