Electrochemical charging of CdSe quantum dot films: dependence on void size and counterion proximity

SC Boehme, H Wang, LDA Siebbeles, D Vanmaekelbergh, AJ Houtepen

Research output: Contribution to journal › Article › Scientific › peer-review

61 Citations (Scopus)

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@article{5939ea5c7cb249fdb13ecf8855fb0251,

title = "Electrochemical charging of CdSe quantum dot films: dependence on void size and counterion proximity",

author = "SC Boehme and H Wang and LDA Siebbeles and D Vanmaekelbergh and AJ Houtepen",

year = "2013",

doi = "10.1021/nn3058455",

language = "English",

volume = "7",

pages = "2500--2508",

journal = "ACS Nano",

issn = "1936-0851",

publisher = "American Chemical Society (ACS)",

number = "3",

}

TY - JOUR

T1 - Electrochemical charging of CdSe quantum dot films: dependence on void size and counterion proximity

AU - Boehme, SC

AU - Wang, H

AU - Siebbeles, LDA

AU - Vanmaekelbergh, D

AU - Houtepen, AJ

PY - 2013

Y1 - 2013

UR - https://www.scopus.com/pages/publications/84875650386

U2 - 10.1021/nn3058455

DO - 10.1021/nn3058455

M3 - Article

SN - 1936-0851

VL - 7

SP - 2500

EP - 2508

JO - ACS Nano

JF - ACS Nano

IS - 3

ER -