Electrochemical depth profiling of multilayer metallic structures: An aluminium brazing sheet

F Norouzi Afshar, R Ambat, C Kwakernaak, JHW de Wit, JMC Mol, HA Terryn

    Research output: Contribution to journalArticleScientificpeer-review

    16 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)285-293
    Number of pages9
    JournalElectrochimica Acta
    Volume77
    DOIs
    Publication statusPublished - 2012

    Keywords

    • CWTS 0.75 <= JFIS < 2.00

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