Electrochemical depth profiling of multilayer metallic structures: An aluminium brazing sheet

F Norouzi Afshar, R Ambat, C Kwakernaak, JHW de Wit, JMC Mol, HA Terryn

Research output: Contribution to journal › Article › Scientific › peer-review

Keywords

@article{eab72fc6fef7437698b4a70e7d5830b0,

title = "Electrochemical depth profiling of multilayer metallic structures: An aluminium brazing sheet",

keywords = "CWTS 0.75 <= JFIS < 2.00",

author = "{Norouzi Afshar}, F and R Ambat and C Kwakernaak and {de Wit}, JHW and JMC Mol and HA Terryn",

year = "2012",

doi = "10.1016/j.electacta.2012.06-23",

language = "Undefined/Unknown",

volume = "77",

pages = "285--293",

journal = "Electrochimica Acta",

issn = "0013-4686",

publisher = "Elsevier",

}

TY - JOUR

T1 - Electrochemical depth profiling of multilayer metallic structures: An aluminium brazing sheet

AU - Norouzi Afshar, F

AU - Ambat, R

AU - Kwakernaak, C

AU - de Wit, JHW

AU - Mol, JMC

AU - Terryn, HA

PY - 2012

Y1 - 2012

KW - CWTS 0.75 <= JFIS < 2.00

U2 - 10.1016/j.electacta.2012.06-23

DO - 10.1016/j.electacta.2012.06-23

M3 - Article

SN - 0013-4686

VL - 77

SP - 285

EP - 293

JO - Electrochimica Acta

JF - Electrochimica Acta

ER -