Electromigration and diffusion in short Al-Ni-Cr lines

LC Jacobs, AH Verbruggen, AJ Kalkman, S Radelaar

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	Mat. Res. Soc. Proc.
Editors	TNMJC Bravman, JR Lloyd, MA Korhonen
Pages	275-280
Number of pages	6
Publication status	Published - 1998

Cite this

@inproceedings{5e3a9249fe294011ac51cfec5bf31265,

title = "Electromigration and diffusion in short Al-Ni-Cr lines",

author = "LC Jacobs and AH Verbruggen and AJ Kalkman and S Radelaar",

year = "1998",

language = "Undefined/Unknown",

isbn = "155899422X",

pages = "275--280",

editor = "TNMJC Bravman and JR Lloyd and MA Korhonen",

booktitle = "Mat. Res. Soc. Proc.",

}