Electromigration and l/f noise in single-crystalline, bamboo and polycrystalline Al lines

MJC van de Homberg, PFA Alkemade, AH Verbruggen, AG Dirks, E Ochs, S Radelaar

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

    Original languageUndefined/Unknown
    Title of host publicationMRS Symposium, Proc. 'Polycrystalline thin films - Structure, texture, properties and applications III'
    EditorsSMYJS Im, BL Adams, Y Zhu, FR Chen
    Number of pages6
    Publication statusPublished - 1998

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