Electromigration and l/f noise in single-crystalline, bamboo and polycrystalline Al lines

MJC van de Homberg, PFA Alkemade, AH Verbruggen, AG Dirks, E Ochs, S Radelaar

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	MRS Symposium, Proc. 'Polycrystalline thin films - Structure, texture, properties and applications III'
Editors	SMYJS Im, BL Adams, Y Zhu, FR Chen
Pages	307-312
Number of pages	6
Publication status	Published - 1998

Cite this

@inproceedings{632b5bb7c6ad4ad68e6c961771b84431,

title = "Electromigration and l/f noise in single-crystalline, bamboo and polycrystalline Al lines",

author = "{van de Homberg}, MJC and PFA Alkemade and AH Verbruggen and AG Dirks and E Ochs and S Radelaar",

year = "1998",

language = "Undefined/Unknown",

isbn = "1558993762",

pages = "307--312",

editor = "SMYJS Im and BL Adams and Y Zhu and FR Chen",

booktitle = "MRS Symposium, Proc. 'Polycrystalline thin films - Structure, texture, properties and applications III'",

}

Electromigration and l/f noise in single-crystalline, bamboo and polycrystalline Al lines. / van de Homberg, MJC; Alkemade, PFA; Verbruggen, AH et al.
MRS Symposium, Proc. 'Polycrystalline thin films - Structure, texture, properties and applications III'. ed. / SMYJS Im; BL Adams; Y Zhu; FR Chen. 1998. p. 307-312.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

TY - GEN

T1 - Electromigration and l/f noise in single-crystalline, bamboo and polycrystalline Al lines

AU - van de Homberg, MJC

AU - Alkemade, PFA

AU - Verbruggen, AH

AU - Dirks, AG

AU - Ochs, E

AU - Radelaar, S

PY - 1998

Y1 - 1998

M3 - Conference contribution

SN - 1558993762

SP - 307

EP - 312

BT - MRS Symposium, Proc. 'Polycrystalline thin films - Structure, texture, properties and applications III'

A2 - Im, SMYJS

A2 - Adams, BL

A2 - Zhu, Y

A2 - Chen, FR

ER -