Electromigration eliability study of a GMR spin valve device, Materials Reliability in Microelectronics IX.

S Shingubara, Y Takeda, H Sakue, T Takahagi, AH Verbruggen

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

    9 Citations (Scopus)
    Original languageUndefined/Unknown
    Title of host publicationProceedings Materials Reliability in Microelectronics IX, MRS Symposium 563.
    EditorsCA Volkert, AH Verbruggen
    Pages145-150
    Number of pages6
    Publication statusPublished - 1999

    Publication series

    Name
    Name
    Volume1

    Cite this

    Shingubara, S., Takeda, Y., Sakue, H., Takahagi, T., & Verbruggen, AH. (1999). Electromigration eliability study of a GMR spin valve device, Materials Reliability in Microelectronics IX. In CA. Volkert, & AH. Verbruggen (Eds.), Proceedings Materials Reliability in Microelectronics IX, MRS Symposium 563. (pp. 145-150)