Abstract
Without an electron source there is no electron microscope, that’s obvious. For the electron microscopist there are several reasons to know something about the source. Someone knowledgeable decides which microscope to buy; someone equally knowledgeable has to use it when it has been purchased. How is the choice of source reflected in the quality of the images? Being able to use the microscope with a specific source to its optimal performance is another reason. How to operate the microscope without destroying the source? How to recognize that a source does not live up to specification anymore? This chapter starts by introducing the parameters used for describing the quality of electron sources and links these directly to their effect on imaging. The description of the two most important source types (Schottky sources and cold field emission sources) starts with the physics theory of electron emission that is behind their properties. This involves a bit of mathematics that some readers may enjoy and others may want to skip to go directly to practical aspects of the sources. The last part contains a discussion on the relation between source parameters and resolution in STEM that will allow the reader to find the optimum balance between current in the probe and resolution in the image.
| Original language | English |
|---|---|
| Title of host publication | Transmission Electron Microscopy |
| Subtitle of host publication | Diffraction, Imaging, and Spectrometry |
| Editors | C. Barry Carter, David B. Williams |
| Publisher | Springer |
| Pages | 1-15 |
| Number of pages | 16 |
| ISBN (Electronic) | 978-3-319-26651-0 |
| ISBN (Print) | 978-3-319-26649-7 |
| DOIs | |
| Publication status | Published - 2016 |
Keywords
- Characterization and Evaluation of Materials
- Nanoscale Science and Technology
- Spectroscopy/Spectrometry
- Solid State Physics
- Spectroscopy and Microscopy
- Continuum Mechanics and Mechanics of Materials