Electron Sources

    Research output: Chapter in Book/Conference proceedings/Edited volumeChapterScientific

    Abstract

    Without an electron source there is no electron microscope, that’s obvious. For the electron microscopist there are several reasons to know something about the source. Someone knowledgeable decides which microscope to buy; someone equally knowledgeable has to use it when it has been purchased. How is the choice of source reflected in the quality of the images? Being able to use the microscope with a specific source to its optimal performance is another reason. How to operate the microscope without destroying the source? How to recognize that a source does not live up to specification anymore? This chapter starts by introducing the parameters used for describing the quality of electron sources and links these directly to their effect on imaging. The description of the two most important source types (Schottky sources and cold field emission sources) starts with the physics theory of electron emission that is behind their properties. This involves a bit of mathematics that some readers may enjoy and others may want to skip to go directly to practical aspects of the sources. The last part contains a discussion on the relation between source parameters and resolution in STEM that will allow the reader to find the optimum balance between current in the probe and resolution in the image.
    Original languageEnglish
    Title of host publicationTransmission Electron Microscopy
    Subtitle of host publicationDiffraction, Imaging, and Spectrometry
    EditorsC. Barry Carter, David B. Williams
    PublisherSpringer
    Pages1-15
    Number of pages16
    ISBN (Electronic)978-3-319-26651-0
    ISBN (Print)978-3-319-26649-7
    DOIs
    Publication statusPublished - 2016

    Keywords

    • Characterization and Evaluation of Materials
    • Nanoscale Science and Technology
    • Spectroscopy/Spectrometry
    • Solid State Physics
    • Spectroscopy and Microscopy
    • Continuum Mechanics and Mechanics of Materials

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  • Cite this

    Kruit, P. (2016). Electron Sources. In C. B. Carter, & D. B. Williams (Eds.), Transmission Electron Microscopy: Diffraction, Imaging, and Spectrometry (pp. 1-15). Springer. https://doi.org/10.1007/978-3-319-26651-0_1