Electrothermal stability of bipolar transistors at medium and high-current operation regimes

N Nenadovic; WCE Neo; X Liu; Y Lin; LCN de Vreede; V d' Alessandro; LE Larson; M Spirito; L la Spina; LK Nanver

Electrothermal stability of bipolar transistors at medium and high-current operation regimes

N Nenadovic, WCE Neo, X Liu, Y Lin, LCN de Vreede, V d' Alessandro, LE Larson, M Spirito, L la Spina, LK Nanver

Electronic Components, Technology and Materials

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

3 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Proceedings of the 2005 IEEE Bipolar / BiCMOS circuits and technology meeting
Editors	s.n.
Place of Publication	Piscataway
Publisher	IEEE Society
Pages	45-49
Number of pages	5
ISBN (Print)	0-7803-9309-0
Publication status	Published - 2005
Event	2005 IEEE Bipolar / BiCMOS Circuits and Technology Meeting (BCTM 2005), Santa Barbara (CA) USA - Piscataway Duration: 9 Oct 2005 → 11 Oct 2005

Publication series

Name
Publisher	IEEE

Conference

Conference	2005 IEEE Bipolar / BiCMOS Circuits and Technology Meeting (BCTM 2005), Santa Barbara (CA) USA
Period	9/10/05 → 11/10/05

Bibliographical note

Editors onbekend, WPM

Keywords

conference contrib. refereed
Conf.proc. > 3 pag

Cite this

@inproceedings{b8900acbed6c42408bf20c2a0c29b617,

title = "Electrothermal stability of bipolar transistors at medium and high-current operation regimes",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "N Nenadovic and WCE Neo and X Liu and Y Lin and {de Vreede}, LCN and {d' Alessandro}, V and LE Larson and M Spirito and {la Spina}, L and LK Nanver",

note = "Editors onbekend, WPM; 2005 IEEE Bipolar / BiCMOS Circuits and Technology Meeting (BCTM 2005), Santa Barbara (CA) USA ; Conference date: 09-10-2005 Through 11-10-2005",

year = "2005",

language = "Undefined/Unknown",

isbn = "0-7803-9309-0",

publisher = "IEEE Society",

pages = "45--49",

editor = "s.n.",

booktitle = "Proceedings of the 2005 IEEE Bipolar / BiCMOS circuits and technology meeting",

}

Nenadovic, N, Neo, WCE, Liu, X, Lin, Y, de Vreede, LCN, d' Alessandro, V, Larson, LE, Spirito, M, la Spina, L & Nanver, LK 2005, Electrothermal stability of bipolar transistors at medium and high-current operation regimes. in s.n. (ed.), Proceedings of the 2005 IEEE Bipolar / BiCMOS circuits and technology meeting. IEEE Society, Piscataway, pp. 45-49, 2005 IEEE Bipolar / BiCMOS Circuits and Technology Meeting (BCTM 2005), Santa Barbara (CA) USA, 9/10/05.

Electrothermal stability of bipolar transistors at medium and high-current operation regimes. / Nenadovic, N; Neo, WCE; Liu, X et al.
Proceedings of the 2005 IEEE Bipolar / BiCMOS circuits and technology meeting. ed. / s.n. Piscataway: IEEE Society, 2005. p. 45-49.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Electrothermal stability of bipolar transistors at medium and high-current operation regimes

AU - Nenadovic, N

AU - Neo, WCE

AU - Liu, X

AU - Lin, Y

AU - de Vreede, LCN

AU - d' Alessandro, V

AU - Larson, LE

AU - Spirito, M

AU - la Spina, L

AU - Nanver, LK

N1 - Editors onbekend, WPM

PY - 2005

Y1 - 2005

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 0-7803-9309-0

SP - 45

EP - 49

BT - Proceedings of the 2005 IEEE Bipolar / BiCMOS circuits and technology meeting

A2 - s.n., null

PB - IEEE Society

CY - Piscataway

T2 - 2005 IEEE Bipolar / BiCMOS Circuits and Technology Meeting (BCTM 2005), Santa Barbara (CA) USA

Y2 - 9 October 2005 through 11 October 2005

ER -