Emerging Computing Devices: Challenges and Opportunities for Test and Reliability*

Alberto Bosio, Ian O'Connor, Marcello Traiola, Jorge Echavarria, Jürgen Teich, Muhammad Abdullah Hanif, Muhammad Shafique, Said Hamdioui, Bastien Deveautour, Patrick Girard, Arnaud Virazel, Koen Bertels

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

1 Citation (Scopus)

Abstract

The paper addresses some of the opportunities and challenges related to test and reliability of three major emerging computing paradigms; i.e., Quantum Computing, Computing engines based on Deep Neural Networks for AI, and Approximate Computing (AxC). We present a quantum accelerator showing that it can be done even without the presence of very good qubits. Then, we present Dependability for Artificial Intelligence (AI) oriented Hardware. Indeed, AI applications shown relevant resilience properties to faults, meaning that the testing strongly depends on the application behavior rather than on the hardware structure. We will cover AI hardware design issues due to manufacturing defects, aging faults, and soft errors. Finally, We present the use of AxC to reduce the cost of hardening a digital circuit without impacting its reliability. In other words how to go beyond usual modular redundancy scheme.
Original languageEnglish
Title of host publication2021 IEEE European Test Symposium (ETS)
Place of PublicationDanvers
PublisherIEEE
Number of pages10
ISBN (Electronic)978-1-6654-1849-2
ISBN (Print)978-1-6654-4819-2
DOIs
Publication statusPublished - 2021
Event2021 IEEE European Test Symposium (ETS) - Virtual at Bruges, Belgium
Duration: 24 May 202128 May 2021

Conference

Conference2021 IEEE European Test Symposium (ETS)
CountryBelgium
CityVirtual at Bruges
Period24/05/2128/05/21

Keywords

  • Emerging Computing Paradigm
  • Quantum Computing
  • Approximate Computing
  • AI hardware
  • Reliability
  • Testing

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