Enchanced sensitivity computation for BEM based capacitance extraction using the Schur complement technique

Y Bi, S de Graaf, NP van der Meijs

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationProceedings of the 2011 IEEE Custom Integrated Circuits Conference (CICC)
EditorsA Khan et al
Place of PublicationPiscataway, NJ
PublisherIEEE Society
Number of pages4
ISBN (Print)9781457702228
Publication statusPublished - 2011
EventCICC 2011 - San Jose, CA, United States
Duration: 19 Sep 201121 Sep 2011


ConferenceCICC 2011
Country/TerritoryUnited States
CitySan Jose, CA

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