Enchanced sensitivity computation for BEM based capacitance extraction using the Schur complement technique

Y Bi, S de Graaf, NP van der Meijs

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationProceedings of the 2011 IEEE Custom Integrated Circuits Conference (CICC)
EditorsA Khan et al
Place of PublicationPiscataway, NJ
PublisherIEEE Society
Pages1-4
Number of pages4
ISBN (Print)9781457702228
DOIs
Publication statusPublished - 2011
EventCICC 2011 - San Jose, CA, United States
Duration: 19 Sep 201121 Sep 2011

Conference

ConferenceCICC 2011
CountryUnited States
CitySan Jose, CA
Period19/09/1121/09/11

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