@inproceedings{c5e2aab0a4f044ee96de38f46966299a,
title = "Enchanced sensitivity computation for BEM based capacitance extraction using the Schur complement technique",
author = "Y Bi and {de Graaf}, S and {van der Meijs}, NP",
year = "2011",
doi = "10.1109/CICC.2011.6055331",
language = "English",
isbn = "9781457702228",
pages = "1--4",
editor = "{Khan et al}, A",
booktitle = "Proceedings of the 2011 IEEE Custom Integrated Circuits Conference (CICC)",
publisher = "IEEE Society",
note = "CICC 2011 ; Conference date: 19-09-2011 Through 21-09-2011",
}