Enchanced sensitivity computation for BEM based capacitance extraction using the Schur complement technique

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	Proceedings of the 2011 IEEE Custom Integrated Circuits Conference (CICC)
Editors	A Khan et al
Place of Publication	Piscataway, NJ
Publisher	IEEE Society
Pages	1-4
Number of pages	4
ISBN (Print)	9781457702228
DOIs	https://doi.org/10.1109/CICC.2011.6055331
Publication status	Published - 2011
Event	CICC 2011 - San Jose, CA, United States Duration: 19 Sep 2011 → 21 Sep 2011

Access to Document

@inproceedings{c5e2aab0a4f044ee96de38f46966299a,

title = "Enchanced sensitivity computation for BEM based capacitance extraction using the Schur complement technique",

author = "Y Bi and {de Graaf}, S and {van der Meijs}, NP",

year = "2011",

doi = "10.1109/CICC.2011.6055331",

language = "English",

isbn = "9781457702228",

pages = "1--4",

editor = "{Khan et al}, A",

booktitle = "Proceedings of the 2011 IEEE Custom Integrated Circuits Conference (CICC)",

publisher = "IEEE Society",

note = "CICC 2011 ; Conference date: 19-09-2011 Through 21-09-2011",

}

Bi, Y, de Graaf, S & van der Meijs, NP 2011, Enchanced sensitivity computation for BEM based capacitance extraction using the Schur complement technique. in A Khan et al (ed.), Proceedings of the 2011 IEEE Custom Integrated Circuits Conference (CICC). IEEE Society, Piscataway, NJ, pp. 1-4, CICC 2011, San Jose, CA, United States, 19/09/11. https://doi.org/10.1109/CICC.2011.6055331

Proceedings of the 2011 IEEE Custom Integrated Circuits Conference (CICC). ed. / A Khan et al. Piscataway, NJ : IEEE Society, 2011. p. 1-4.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Enchanced sensitivity computation for BEM based capacitance extraction using the Schur complement technique

AU - Bi, Y

AU - de Graaf, S

AU - van der Meijs, NP

PY - 2011

Y1 - 2011

U2 - 10.1109/CICC.2011.6055331

DO - 10.1109/CICC.2011.6055331

M3 - Conference contribution

SN - 9781457702228

SP - 1

EP - 4

BT - Proceedings of the 2011 IEEE Custom Integrated Circuits Conference (CICC)

A2 - Khan et al, A

PB - IEEE Society

CY - Piscataway, NJ

T2 - CICC 2011

Y2 - 19 September 2011 through 21 September 2011

ER -