Erratum to: Sub-gap defect density characterization of molybdenum oxide: An annealing study for solar cell applications (Nano Research, (2020), 13, 12, (3416-3424), 10.1007/s12274-020-3029-9)

Daniele Scirè*, Paul Procel, Antonino Gulino, Olindo Isabella, Miro Zeman, Isodiana Crupi

*Corresponding author for this work

Research output: Contribution to journalComment/Letter to the editorScientificpeer-review

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Abstract

Ref. [56] was unfortunately wrong, Instead of [56] Corless, R. M.; Gonnet, G. H.; Hare, D. E. G.; Jeffrey, D. J.; Knuth, D. E. On the Lambert W function. Adv. Comput. Math. 1996, 5, 329–359. It should be changed to Biswas, R. K.; Khan, P.; Mukherjee, S.; Mukhopadhyay, A. K.; Ghosh, J.; Muraleedharan, K. Study of short range structure of amorphous Silica from PDF using Ag radiation in laboratory XRD system, RAMAN and NEXAFS. J. Non. Cryst. Solids 2018, 488, 1–9. Some entries in Table 2 were unfortunately misprinted.

Original languageEnglish
Pages (from-to)7752-7753
Number of pages2
JournalNano Research
Volume15
Issue number8
DOIs
Publication statusPublished - 2022

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