Error analysis and reliability of zero-order Lamb mode inversion for waveguide characterization

A. Sabbadini*, J. Massaad, P. L.M.J. van Neer, N. de Jong, M. D. Verweij

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

2 Citations (Scopus)
49 Downloads (Pure)

Fingerprint

Dive into the research topics of 'Error analysis and reliability of zero-order Lamb mode inversion for waveguide characterization'. Together they form a unique fingerprint.

INIS

Physics

Engineering