Estimation of defocus and astigmatism in transmission electron microscopy

M Vulovic, PL Brandt, RBG Ravelli, AJ Koster, LJ van Vliet, B Rieger

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    4 Citations (Scopus)
    Original languageEnglish
    Title of host publicationProc. 2010 IEEE International Symposium on Biomedical Imaging: From Nano to Macro
    Editors s.n.
    Place of Publications.n.
    Publishers.n.
    Pages1121-1124
    Number of pages4
    ISBN (Print)978-1-4244-4126-6
    Publication statusPublished - 2010
    EventISBI 2010, IEEE International Symposium on Biomedical Imaging: From Nano to Macro - Piscataway, NJ, USA, Rotterdam, Netherlands
    Duration: 14 Apr 201017 Apr 2010

    Publication series

    Name
    Publishers.n.

    Conference

    ConferenceISBI 2010, IEEE International Symposium on Biomedical Imaging
    Country/TerritoryNetherlands
    CityRotterdam
    Period14/04/1017/04/10

    Keywords

    • Conf.proc. > 3 pag

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