Estimation of dielectric loss using damped AC voltages

KR Hooft van Huysuynen, E Gulski, JJ Smit, LA Chmura

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	International Conference on Condition Monitoring and Diagnosis 2010
Editors	s.n.
Place of Publication	Tokyo, Japan
Publisher	s.n.
Pages	603-606
Number of pages	4
Publication status	Published - 2010
Event	International Conference on Condition Monitoring and Diagnosis 2010, Tokyo, Japan - Tokyo, Japan Duration: 6 Sept 2010 → 11 Sept 2010

Name
Publisher	s.n.

Conference	International Conference on Condition Monitoring and Diagnosis 2010, Tokyo, Japan
Period	6/09/10 → 11/09/10

Keywords

@inproceedings{c9dd650dcd3940829705ef8e9cc43812,

title = "Estimation of dielectric loss using damped AC voltages",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "{Hooft van Huysuynen}, KR and E Gulski and JJ Smit and LA Chmura",

year = "2010",

language = "English",

publisher = "s.n.",

pages = "603--606",

editor = "s.n.",

booktitle = "International Conference on Condition Monitoring and Diagnosis 2010",

note = "International Conference on Condition Monitoring and Diagnosis 2010, Tokyo, Japan ; Conference date: 06-09-2010 Through 11-09-2010",

}

TY - GEN

T1 - Estimation of dielectric loss using damped AC voltages

AU - Hooft van Huysuynen, KR

AU - Gulski, E

AU - Smit, JJ

AU - Chmura, LA

PY - 2010

Y1 - 2010

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SP - 603

EP - 606

BT - International Conference on Condition Monitoring and Diagnosis 2010

A2 - s.n., null

PB - s.n.

CY - Tokyo, Japan

T2 - International Conference on Condition Monitoring and Diagnosis 2010, Tokyo, Japan

Y2 - 6 September 2010 through 11 September 2010

ER -