Estimation of unknown structure parameters from high-resolution (S)TEM images : what are the limits?

AJ den Dekker, J Gonnissen, A De Backer, J Sijbers, S van Aert

Research output: Contribution to journalArticleScientificpeer-review

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Original languageEnglish
Pages (from-to)34-43
Number of pages10
JournalUltramicroscopy
Volume134
DOIs
Publication statusPublished - 2013

Bibliographical note

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Keywords

  • CWTS 0.75 <= JFIS < 2.00

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