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Dive into the research topics of 'Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects'. Together they form a unique fingerprint.- Sort by
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Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Leticia Bolzani Poehls, Tiago Balen
Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review