Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects

Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Leticia Bolzani Poehls, Tiago Balen

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

1 Citation (Scopus)
17 Downloads (Pure)

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Engineering & Materials Science