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Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects
Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Leticia Bolzani Poehls, Tiago Balen
Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
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