@inproceedings{3ace91f0ac9a4b14bf559d04d7d6ef51,
title = "Evaluating the self-heating thermal resistance of bipolar transistors by DC measurements: A critical review and update",
keywords = "Conf.proc. > 3 pag",
author = "S Russo and {d' Alessandro}, V and {la Spina}, L and N Rinaldi and LK Nanver",
year = "2009",
language = "Undefined/Unknown",
isbn = "978-1-4244-4895-1",
publisher = "IEEE",
pages = "95--98",
editor = "F Thiel and D Ngo",
booktitle = "Proc. of IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) 2009",
address = "United States",
note = "IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) 2009 ; Conference date: 13-10-2009 Through 14-10-2009",
}