Evaluating the self-heating thermal resistance of bipolar transistors by DC measurements: A critical review and update

S Russo, V d' Alessandro, L la Spina, N Rinaldi, LK Nanver

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

12 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationProc. of IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) 2009
EditorsF Thiel, D Ngo
Place of PublicationCapri, Italy
PublisherIEEE Society
Pages95-98
Number of pages4
ISBN (Print)978-1-4244-4895-1
Publication statusPublished - 2009
EventIEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) 2009 - Capri, Italy
Duration: 13 Oct 200914 Oct 2009

Publication series

Name
PublisherIEEE

Conference

ConferenceIEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) 2009
Period13/10/0914/10/09

Keywords

  • Conf.proc. > 3 pag

Cite this

Russo, S., d' Alessandro, V., la Spina, L., Rinaldi, N., & Nanver, LK. (2009). Evaluating the self-heating thermal resistance of bipolar transistors by DC measurements: A critical review and update. In F. Thiel, & D. Ngo (Eds.), Proc. of IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) 2009 (pp. 95-98). IEEE Society.