Evaluation of HBT device linearity using advanced measurement techniques

K Buisman, LCN de Vreede, M Marchetti, MP Heijden, PJ Zampardi

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

4 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings 43rd European Microwave Conference 2013
EditorsLP Schmidt, T Zwick
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages259-262
Number of pages4
ISBN (Print)978-2-87487-031-6
Publication statusPublished - 2013
EventEuMC 2013 - Nuremberg, Germany
Duration: 6 Oct 201310 Oct 2013

Publication series

Name
PublisherIEEE

Conference

ConferenceEuMC 2013
Country/TerritoryGermany
CityNuremberg
Period6/10/1310/10/13

Bibliographical note

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