Evaluation of HBT device linearity using advanced measurement techniques

K Buisman; LCN de Vreede; M Marchetti; MP Heijden; PJ Zampardi

Evaluation of HBT device linearity using advanced measurement techniques

K Buisman
, LCN de Vreede
, M Marchetti
, MP Heijden
, PJ Zampardi

Electronics

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

4 Citations (Scopus)

Original language	English
Title of host publication	Proceedings 43rd European Microwave Conference 2013
Editors	LP Schmidt, T Zwick
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE
Pages	259-262
Number of pages	4
ISBN (Print)	978-2-87487-031-6
Publication status	Published - 2013
Event	EuMC 2013 - Nuremberg, Germany Duration: 6 Oct 2013 → 10 Oct 2013

Publication series

Name
Publisher	IEEE

Conference

Conference	EuMC 2013
Country/Territory	Germany
City	Nuremberg
Period	6/10/13 → 10/10/13

Bibliographical note

Harvest

Cite this

@inproceedings{d4a9b0c1b1844c20ab23f4072fa2bc1d,

title = "Evaluation of HBT device linearity using advanced measurement techniques",

author = "K Buisman and \{de Vreede\}, LCN and M Marchetti and MP Heijden and PJ Zampardi",

note = "Harvest; EuMC 2013 ; Conference date: 06-10-2013 Through 10-10-2013",

year = "2013",

language = "English",

isbn = "978-2-87487-031-6",

publisher = "IEEE",

pages = "259--262",

editor = "LP Schmidt and T Zwick",

booktitle = "Proceedings 43rd European Microwave Conference 2013",

address = "United States",

}

Evaluation of HBT device linearity using advanced measurement techniques. / Buisman, K; de Vreede, LCN; Marchetti, M et al.
Proceedings 43rd European Microwave Conference 2013. ed. / LP Schmidt; T Zwick. Piscataway, NJ, USA: IEEE, 2013. p. 259-262.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Evaluation of HBT device linearity using advanced measurement techniques

AU - Buisman, K

AU - de Vreede, LCN

AU - Marchetti, M

AU - Heijden, MP

AU - Zampardi, PJ

N1 - Harvest

PY - 2013

Y1 - 2013

UR - http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6686640

M3 - Conference contribution

SN - 978-2-87487-031-6

SP - 259

EP - 262

BT - Proceedings 43rd European Microwave Conference 2013

A2 - Schmidt, LP

A2 - Zwick, T

PB - IEEE

CY - Piscataway, NJ, USA

T2 - EuMC 2013

Y2 - 6 October 2013 through 10 October 2013

ER -

Evaluation of HBT device linearity using advanced measurement techniques

Publication series

Conference

Bibliographical note

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Cite this