Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects

Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Leticia Bolzani Poehls, Tiago Balen

Research output: Contribution to journalArticleScientificpeer-review

3 Citations (Scopus)
107 Downloads (Pure)

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