Evaluation of SRAM faulty behavior under bit line coupling

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

5 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publication3rd International Design and Test workshop
Editors s.n.
Place of PublicationPiscataway
PublisherIEEE Society
Pages231-236
Number of pages6
ISBN (Print)978-1-4244-3477-0
Publication statusPublished - 2008
EventIDT2008 - Piscataway
Duration: 20 Dec 200822 Dec 2008

Publication series

Name
PublisherIEEE

Conference

ConferenceIDT2008
Period20/12/0822/12/08

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

Cite this

Al-Ars, Z., & Hamdioui, S. (2008). Evaluation of SRAM faulty behavior under bit line coupling. In s.n. (Ed.), 3rd International Design and Test workshop (pp. 231-236). IEEE Society.