Evidence for mean free path fluctuation induced pinning in YBa2Cu3O7 and YBa2Cu4O8 films

R. Griessen*, Hai-Hu Wen Hai-Hu, A. J.J. Van Dalen, B. Dam, J. Rector, H. G. Schnack, S. Libbrecht, E. Osquiguil, Y. Bruynseraede

*Corresponding author for this work

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