Experimental characterisation of roughness induced scattering loss in Si and SiC waveguide sensors

E Margallo, CK Yang, G Pandraud, PJ French

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

2 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of IEEE SENSORS 2009
EditorsSC Mukhopadhyay
PublisherIEEE Society
Pages1557-1561
Number of pages5
ISBN (Print)978-1-4244-5335-1
Publication statusPublished - 2009
EventIEEE Sensors 2009 Conference - Christchurch, New Zealand
Duration: 25 Oct 200928 Oct 2009

Conference

ConferenceIEEE Sensors 2009 Conference
CountryNew Zealand
CityChristchurch
Period25/10/0928/10/09

Keywords

  • Conf.proc. > 3 pag

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