@inproceedings{bd99b0db7f0047dda8dfe06d1c65d513,
title = "Experimental characterisation of roughness induced scattering loss in Si and SiC waveguide sensors",
keywords = "Conf.proc. > 3 pag",
author = "E Margallo and CK Yang and G Pandraud and PJ French",
year = "2009",
language = "English",
isbn = "978-1-4244-5335-1",
pages = "1557--1561",
editor = "SC Mukhopadhyay",
booktitle = "Proceedings of IEEE SENSORS 2009",
publisher = "IEEE Society",
note = "IEEE Sensors 2009 Conference ; Conference date: 25-10-2009 Through 28-10-2009",
}