Experimental characterization of roughness induced scattering losses in PECVD SiC waveguides

G Pandraud, E Margallo-Balbás, CK Yang, PJ French

Research output: Contribution to journalArticleScientificpeer-review

12 Citations (Scopus)
Original languageEnglish
Pages (from-to)744-749
Number of pages6
JournalJournal of Lightwave Technology
Volume29
Issue number5
DOIs
Publication statusPublished - 2011

Keywords

  • academic journal papers
  • CWTS JFIS < 0.75

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