Experimental procedure to optimize out-of-band terminations for highly linear and power efficient bipolar class-AB RF amplifiers

M Spirito; MP van der Heijden; M J Pelk; LCN de Vreede; PJ Zampardi; LE Larson; JN Burghartz

Experimental procedure to optimize out-of-band terminations for highly linear and power efficient bipolar class-AB RF amplifiers

M Spirito, MP van der Heijden, M J Pelk, LCN de Vreede, PJ Zampardi, LE Larson, JN Burghartz

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

8 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Proceedings of the 2005 IEEE Bipolar / BiCMOS circuits and technology meeting
Editors	s.n.
Place of Publication	Piscataway
Publisher	IEEE Society
Pages	112-115
Number of pages	4
Publication status	Published - 2005
Event	2005 IEEE Bipolar / BiCMOS circuits and technology meeting, Santa Barbara, CA, USAeting (BCTM2005) - Piscataway Duration: 9 Oct 2005 → 11 Oct 2005

Publication series

Name
Publisher	IEEE

Conference

Conference	2005 IEEE Bipolar / BiCMOS circuits and technology meeting, Santa Barbara, CA, USAeting (BCTM2005)
Period	9/10/05 → 11/10/05

Bibliographical note

Editor onbekend JH

Keywords

conference contrib. refereed
Conf.proc. > 3 pag

Cite this

Spirito, M., van der Heijden, MP., Pelk, M. J., de Vreede, LCN., Zampardi, PJ., Larson, LE., & Burghartz, JN. (2005). Experimental procedure to optimize out-of-band terminations for highly linear and power efficient bipolar class-AB RF amplifiers. In s.n. (Ed.), Proceedings of the 2005 IEEE Bipolar / BiCMOS circuits and technology meeting (pp. 112-115). IEEE Society.

Spirito, M ; van der Heijden, MP ; Pelk, M J ; de Vreede, LCN ; Zampardi, PJ ; Larson, LE ; Burghartz, JN. / Experimental procedure to optimize out-of-band terminations for highly linear and power efficient bipolar class-AB RF amplifiers. Proceedings of the 2005 IEEE Bipolar / BiCMOS circuits and technology meeting. editor / s.n. Piscataway : IEEE Society, 2005. pp. 112-115

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title = "Experimental procedure to optimize out-of-band terminations for highly linear and power efficient bipolar class-AB RF amplifiers",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "M Spirito and {van der Heijden}, MP and Pelk, {M J} and {de Vreede}, LCN and PJ Zampardi and LE Larson and JN Burghartz",

note = "Editor onbekend JH; null ; Conference date: 09-10-2005 Through 11-10-2005",

year = "2005",

language = "Undefined/Unknown",

publisher = "IEEE Society",

pages = "112--115",

editor = "s.n.",

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Spirito, M, van der Heijden, MP, Pelk, MJ , de Vreede, LCN, Zampardi, PJ, Larson, LE & Burghartz, JN 2005, Experimental procedure to optimize out-of-band terminations for highly linear and power efficient bipolar class-AB RF amplifiers. in s.n. (ed.), Proceedings of the 2005 IEEE Bipolar / BiCMOS circuits and technology meeting. IEEE Society, Piscataway, pp. 112-115, 2005 IEEE Bipolar / BiCMOS circuits and technology meeting, Santa Barbara, CA, USAeting (BCTM2005), 9/10/05.

Experimental procedure to optimize out-of-band terminations for highly linear and power efficient bipolar class-AB RF amplifiers. / Spirito, M; van der Heijden, MP; Pelk, M J ; de Vreede, LCN; Zampardi, PJ; Larson, LE; Burghartz, JN.

Proceedings of the 2005 IEEE Bipolar / BiCMOS circuits and technology meeting. ed. / s.n. Piscataway : IEEE Society, 2005. p. 112-115.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Experimental procedure to optimize out-of-band terminations for highly linear and power efficient bipolar class-AB RF amplifiers

AU - Spirito, M

AU - van der Heijden, MP

AU - Pelk, M J

AU - de Vreede, LCN

AU - Zampardi, PJ

AU - Larson, LE

AU - Burghartz, JN

N1 - Editor onbekend JH

PY - 2005

Y1 - 2005

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SP - 112

EP - 115

BT - Proceedings of the 2005 IEEE Bipolar / BiCMOS circuits and technology meeting

A2 - s.n., null

PB - IEEE Society

CY - Piscataway

Y2 - 9 October 2005 through 11 October 2005

ER -