Abstract
Today's computer architectures and semiconductor technologies are facing major challenges making them incapable to deliver the required features (such as computer efficiency) for emerging applications. Alternative architectures are being under investigation in order to continue deliver sustainable benefits for the foreseeable future society at affordable cost. These architectures are not only changing the traditional computing paradigm (e.g., in terms of programming models, compilers, circuit design), but also setting up new challenges and opportunities concerning the test and reliability. This tutorial targets the challenges and opportunities of using approximate computing for achieving low cost fault tolerance mechanisms.
Original language | English |
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Title of host publication | Proceedings - 2020 15th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2020 |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
Number of pages | 2 |
ISBN (Electronic) | 9781728154268 |
DOIs | |
Publication status | Published - 1 Apr 2020 |
Event | 15th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2020 - Marrakesh, Morocco Duration: 1 Apr 2020 → 3 Apr 2020 Conference number: 15 |
Conference
Conference | 15th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2020 |
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Abbreviated title | DTIS 2020 |
Country/Territory | Morocco |
City | Marrakesh |
Period | 1/04/20 → 3/04/20 |
Other | Virtual/online event due to COVID-19 |
Bibliographical note
Virtual/online event due to COVID-19Accepted author manuscript
Keywords
- Approximate computing
- Fault model
- Reliability
- Test