Exploiting Network-on-Chip Structural Redundancy for a Cooperative and Scalable Built-In Self-Test Architecture

A Strano, C Gomez, D Ludovici, M Favalli, ME Gomez, D Bertozzi

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

17 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings Design, Automation and Test in Europe Conference and Exhibition (DATE 2011)
EditorsBM Al-Hashimi, W Rosenstiel
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages661-666
Number of pages6
ISBN (Print)978-3-9810801-7-9
Publication statusPublished - 2011
EventDATE'11 - Leuven, Belgium
Duration: 14 Mar 201118 Mar 2011

Publication series

Name
PublisherIEEE

Conference

ConferenceDATE'11
Period14/03/1118/03/11

Keywords

  • Elektrotechniek
  • Techniek
  • Conf.proc. > 3 pag

Cite this

Strano, A., Gomez, C., Ludovici, D., Favalli, M., Gomez, ME., & Bertozzi, D. (2011). Exploiting Network-on-Chip Structural Redundancy for a Cooperative and Scalable Built-In Self-Test Architecture. In BM. Al-Hashimi, & W. Rosenstiel (Eds.), Proceedings Design, Automation and Test in Europe Conference and Exhibition (DATE 2011) (pp. 661-666). IEEE Society.