Exploiting PUF Variation to Detect Fault Injection Attacks

Troya Köylü*, Luiza Garaffa, Cezar Reinbrecht, Mahdi Zahedi, Said Hamdioui, Mottaqiallah Taouil*

*Corresponding author for this work

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

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Abstract

The massive deployment of Internet of Things (IoT) devices makes them vulnerable against physical tampering attacks, such as fault injection. These kind of hardware attacks are very popular as they typically do not require complex equipment or high expertise. Hence, it is important that IoT devices are protected against them. In this work, we present a novel fault injection attack detector with high flexibility and low overhead. Our solution is based on the reuse of a security primitive used in many IoT devices, i.e., ring oscillator (RO) physically unclonable function (PUF). Our results show that we obtain a high detection effectiveness and no false alarms against most popular fault injection attacks based on voltage and clock manipulations.
Original languageEnglish
Title of host publicationProceedings of the 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
EditorsHana Kubatova, Andreas Steininger, Maksim Jenihhin, Tomasz Garbolino, Petr Fiser, Jan Belohoubek, Jaroslav Borecky
Place of PublicationDanvers
PublisherIEEE
Pages74-79
Number of pages6
ISBN (Electronic)978-1-6654-9431-1
ISBN (Print)978-1-6654-9432-8
DOIs
Publication statusPublished - 2022
Event2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) - Prague, Czech Republic
Duration: 6 Apr 20228 Apr 2022
Conference number: 25th

Publication series

NameProceedings - 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2022

Conference

Conference2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
Abbreviated titleDDECS 2022
Country/TerritoryCzech Republic
CityPrague
Period6/04/228/04/22

Bibliographical note

Accepted author manuscript

Keywords

  • fault injection detection
  • PUF
  • RO
  • IoT
  • hardware security

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