Exploring the feasibility of an aging model for paper insulation based on the repetition frequency of transients

TL Koltunowicz; G Bajracharya; D Djairam; JJ Smit

doi:doi:10.1109/ELINSL.2010.5549773

Exploring the feasibility of an aging model for paper insulation based on the repetition frequency of transients

TL Koltunowicz, G Bajracharya, D Djairam, JJ Smit

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	IEEE International Symposium on Electrical Insulation
Editors	s.n.
Place of Publication	San Diego
Publisher	IEEE
Pages	1-5
Number of pages	5
ISBN (Print)	978-1-4244-6298-8
DOIs	https://doi.org/doi:10.1109/ELINSL.2010.5549773
Publication status	Published - 2010
Event	2010 IEEE International symposium on electrical insulation (ISEI), San Diego - Piscataway Duration: 6 Jun 2010 → 9 Jun 2010

Publication series

Name
Publisher	IEEE

Conference

Conference	2010 IEEE International symposium on electrical insulation (ISEI), San Diego
Period	6/06/10 → 9/06/10

Keywords

conference contrib. refereed
Conf.proc. > 3 pag

Access to Document

doi:10.1109/ELINSL.2010.5549773

Cite this

@inproceedings{264e290ec25947bea437500e7564e85e,

title = "Exploring the feasibility of an aging model for paper insulation based on the repetition frequency of transients",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "TL Koltunowicz and G Bajracharya and D Djairam and JJ Smit",

year = "2010",

doi = "doi:10.1109/ELINSL.2010.5549773",

language = "Undefined/Unknown",

isbn = "978-1-4244-6298-8",

publisher = "IEEE",

pages = "1--5",

editor = "s.n.",

booktitle = "IEEE International Symposium on Electrical Insulation",

address = "United States",

note = "2010 IEEE International symposium on electrical insulation (ISEI), San Diego ; Conference date: 06-06-2010 Through 09-06-2010",

}

Koltunowicz, TL, Bajracharya, G, Djairam, D & Smit, JJ 2010, Exploring the feasibility of an aging model for paper insulation based on the repetition frequency of transients. in s.n. (ed.), IEEE International Symposium on Electrical Insulation. IEEE, San Diego, pp. 1-5, 2010 IEEE International symposium on electrical insulation (ISEI), San Diego, 6/06/10. https://doi.org/doi:10.1109/ELINSL.2010.5549773

Exploring the feasibility of an aging model for paper insulation based on the repetition frequency of transients. / Koltunowicz, TL; Bajracharya, G; Djairam, D et al.
IEEE International Symposium on Electrical Insulation. ed. / s.n. San Diego: IEEE, 2010. p. 1-5.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Exploring the feasibility of an aging model for paper insulation based on the repetition frequency of transients

AU - Koltunowicz, TL

AU - Bajracharya, G

AU - Djairam, D

AU - Smit, JJ

PY - 2010

Y1 - 2010

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

U2 - doi:10.1109/ELINSL.2010.5549773

DO - doi:10.1109/ELINSL.2010.5549773

M3 - Conference contribution

SN - 978-1-4244-6298-8

SP - 1

EP - 5

BT - IEEE International Symposium on Electrical Insulation

A2 - s.n., null

PB - IEEE

CY - San Diego

T2 - 2010 IEEE International symposium on electrical insulation (ISEI), San Diego

Y2 - 6 June 2010 through 9 June 2010

ER -