Extended abstract: Test them all, is it worth it? Assessing configuration sampling on the JHipster Web development stack

Axel Halin, Alexandre Nuttinck, Mathieu Acher, Xavier Devroey, Gilles Perrouin, Benoit Baudry

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

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Abstract

This is an extended abstract of the article: Axel Halin, Alexandre Nuttinck, Mathieu Acher, Xavier Devroey, Gilles Perrouin, and Benoit Baudry. 2018. Test them all, is it worth it? Assessing config- uration sampling on the JHipster Web development stack. In Em- pirical Software Engineering (17 Jul 2018). https://doi.org/10.1007/ s10664-018-9635-4.
Original languageEnglish
Title of host publicationProceedings of the 24th ACM International Systems and Software Product Line Conference (SPLC '20)
PublisherACM DL
Number of pages1
VolumeA
DOIs
Publication statusAccepted/In press - Jul 2020
Event24th ACM International Systems and Software Product Line Conference - Montreal, Canada
Duration: 19 Oct 202023 Oct 2020
Conference number: 24
http://splc2020.net

Conference

Conference24th ACM International Systems and Software Product Line Conference
Abbreviated titleSPLC '20
CountryCanada
CityMontreal
Period19/10/2023/10/20
Internet address

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  • Cite this

    Halin, A., Nuttinck, A., Acher, M., Devroey, X., Perrouin, G., & Baudry, B. (Accepted/In press). Extended abstract: Test them all, is it worth it? Assessing configuration sampling on the JHipster Web development stack. In Proceedings of the 24th ACM International Systems and Software Product Line Conference (SPLC '20) (Vol. A). ACM DL. https://doi.org/10.1145/3382025.3414985