Extended mextram model to wide frequency range

HC Wu; S Mijalkovic; JN Burghartz

Extended mextram model to wide frequency range

HC Wu, S Mijalkovic, JN Burghartz

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	SAFE 2003; proceedings of the sixth annual workshop on semiconductor advances for future electronics
Editors	s.n.
Place of Publication	Utrecht
Publisher	STW
Pages	668-671
Number of pages	4
ISBN (Print)	90-73461-39-1
Publication status	Published - 2003
Event	Sixth annual workshop on semiconductor advances for future electronics, Veldhoven, The Netherlands - Utrecht Duration: 25 Nov 2003 → 26 Nov 2003

Publication series

Name
Publisher	STW

Conference

Conference	Sixth annual workshop on semiconductor advances for future electronics, Veldhoven, The Netherlands
Period	25/11/03 → 26/11/03

Keywords

Vakpubl., Overig wet. > 3 pag

Cite this

@inproceedings{12dfaf91eeb84f149fb06df8565fc3b0,

title = "Extended mextram model to wide frequency range",

keywords = "Vakpubl., Overig wet. > 3 pag",

author = "HC Wu and S Mijalkovic and JN Burghartz",

year = "2003",

language = "Undefined/Unknown",

isbn = "90-73461-39-1",

publisher = "STW",

pages = "668--671",

editor = "s.n.",

booktitle = "SAFE 2003; proceedings of the sixth annual workshop on semiconductor advances for future electronics",

note = "Sixth annual workshop on semiconductor advances for future electronics, Veldhoven, The Netherlands ; Conference date: 25-11-2003 Through 26-11-2003",

}

TY - GEN

T1 - Extended mextram model to wide frequency range

AU - Wu, HC

AU - Mijalkovic, S

AU - Burghartz, JN

PY - 2003

Y1 - 2003

KW - Vakpubl., Overig wet. > 3 pag

M3 - Conference contribution

SN - 90-73461-39-1

SP - 668

EP - 671

BT - SAFE 2003; proceedings of the sixth annual workshop on semiconductor advances for future electronics

A2 - s.n., null

PB - STW

CY - Utrecht

T2 - Sixth annual workshop on semiconductor advances for future electronics, Veldhoven, The Netherlands

Y2 - 25 November 2003 through 26 November 2003

ER -