Extracting device parameters from measurements on a metal single elctron tunneling transistor

RH Klunder, J Hoekstra

Research output: Book/ReportReportProfessional

Original languageUndefined/Unknown
Place of PublicationDelft
PublisherTechnische Universiteit Delft, Faculty ITS
Number of pages63
Publication statusPublished - 2001

Publication series

Name
PublisherTechnische Universiteit Delft, Faculty ITS

Keywords

  • ZX Int.klas.verslagjaar < 2002

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