Eyring acceleration model in thick nitride/oxide dielectrics

SB Ir. Evseev

Research output: Contribution to journalArticleScientificpeer-review

3 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)748-751
Number of pages4
JournalMicroelectronics Reliability
Volume47
Publication statusPublished - 2007

Keywords

  • Elektrotechniek
  • Techniek
  • academic journal papers
  • CWTS JFIS < 0.75

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