Facilitating automatic test pattern generators using test point insertion

MJ Geuzebroek, AJ van de Goor Ph D, JT van Linden

Research output: Chapter in Book/Conference proceedings/Edited volume › Chapter › Scientific

Original language	Undefined/Unknown
Title of host publication	Global Semiconductor Manufacturing Technology
Publisher	Business Briefing
Pages	149-152
ISBN (Print)	190315037X
Publication status	Published - 2001

Keywords

@inbook{36977deb655f46ab9209b197a05235e3,

title = "Facilitating automatic test pattern generators using test point insertion",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "MJ Geuzebroek and {van de Goor Ph D}, AJ and {van Linden}, JT",

year = "2001",

language = "Undefined/Unknown",

isbn = "190315037X",

pages = "149--152",

booktitle = "Global Semiconductor Manufacturing Technology",

publisher = "Business Briefing",

}