Abstract
A major limitation in current liquid phase crystallized (LPC) silicon thin-film record solar cells are optical losses caused by their planar glass-silicon interface. In this study, silicon is grown on nanoimprinted periodically as well as on randomly textured glass substrates and successfully implemented into state-of-the-art LPC silicon thin-film solar cell stacks. By systematically varying every layer the whole sample stack is optimized regarding its anti-reflection ability. Compared to an optimized planar reference device, a reduction of reflection losses by -3.5% (absolute) on the random and by -9.4% (absolute) on the periodic texture has been achieved in the wavelength range of interest.
Original language | English |
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Title of host publication | 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 |
Place of Publication | Piscataway, NJ |
Publisher | IEEE |
Pages | 672-677 |
Number of pages | 6 |
ISBN (Electronic) | 978-1-5090-2724-8 |
DOIs | |
Publication status | Published - 2016 |
Event | PVSC 2016: 43rd IEEE Photovoltaic Specialists Conference - Portland, OR, United States Duration: 5 Jun 2016 → 10 Jun 2016 Conference number: 43 http://www.ieee-pvsc.org/PVSC44/ |
Conference
Conference | PVSC 2016 |
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Abbreviated title | PVSC 2016 |
Country/Territory | United States |
City | Portland, OR |
Period | 5/06/16 → 10/06/16 |
Internet address |
Keywords
- absorption enhancement
- light management
- silicon
- thin-film solar cells