Far-field beam pattern technique for high pointing accuracy characterization of GUSTO HEB mixer arrays

Research output: Contribution to conference › Paper › peer-review

24 Downloads (Pure)

Original language	English
Pages	185-185
Number of pages	1
Publication status	Published - 2019
Event	2019 30th International Symposium on Space Terahertz Technology, ISSTT 2019 - Gothenburg, Sweden Duration: 15 Apr 2019 → 17 Apr 2019

Conference	2019 30th International Symposium on Space Terahertz Technology, ISSTT 2019
Country/Territory	Sweden
City	Gothenburg
Period	15/04/19 → 17/04/19

Access to Document

@conference{0bf776e9e77b47f8a2b8ffb3b5ed1803,

title = "Far-field beam pattern technique for high pointing accuracy characterization of GUSTO HEB mixer arrays",

author = "Silva, {J. R.} and Stephen Yates and W. Laauwen and M. Finkel and Gao, {J. R.}",

year = "2019",

language = "English",

pages = "185--185",

note = "2019 30th International Symposium on Space Terahertz Technology, ISSTT 2019 ; Conference date: 15-04-2019 Through 17-04-2019",

}

TY - CONF

T1 - Far-field beam pattern technique for high pointing accuracy characterization of GUSTO HEB mixer arrays

AU - Silva, J. R.

AU - Yates, Stephen

AU - Laauwen, W.

AU - Finkel, M.

AU - Gao, J. R.

PY - 2019

Y1 - 2019

UR - http://www.scopus.com/inward/record.url?scp=85088357686&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:85088357686

SP - 185

EP - 185

T2 - 2019 30th International Symposium on Space Terahertz Technology, ISSTT 2019

Y2 - 15 April 2019 through 17 April 2019

ER -