Far-infrared transient grating measurements of electron cooling in InAs and GaSb with sub-picosecond time resolution

PCM Planken, HPM Pellemans, WT Wenckebach

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	Proceedings: "Physics of Semiconductors" 23rd International Conference on the Physics of Semiconductors (ICPS'96)
Editors	M Scheffer, R Zimmermann
Place of Publication	Singapore
Publisher	World Scientific
Pages	725-728
Number of pages	4
Publication status	Published - 1996
Event	23rd International Conference on the Physics of Semiconductors (ICPS'96) - Singapore Duration: 21 Jul 1996 → 26 Jul 1996

Name
Publisher	World Scientific

Conference	23rd International Conference on the Physics of Semiconductors (ICPS'96)
Period	21/07/96 → 26/07/96

Cite this

@inproceedings{dea964ac5cd1466b80e1014539cbe0d7,

title = "Far-infrared transient grating measurements of electron cooling in InAs and GaSb with sub-picosecond time resolution",

author = "PCM Planken and HPM Pellemans and WT Wenckebach",

year = "1996",

language = "Undefined/Unknown",

publisher = "World Scientific",

pages = "725--728",

editor = "M Scheffer and R Zimmermann",

booktitle = "Proceedings: {"}Physics of Semiconductors{"} 23rd International Conference on the Physics of Semiconductors (ICPS'96)",

note = "23rd International Conference on the Physics of Semiconductors (ICPS'96) ; Conference date: 21-07-1996 Through 26-07-1996",

}

Planken, PCM, Pellemans, HPM & Wenckebach, WT 1996, Far-infrared transient grating measurements of electron cooling in InAs and GaSb with sub-picosecond time resolution. in M Scheffer & R Zimmermann (eds), Proceedings: "Physics of Semiconductors" 23rd International Conference on the Physics of Semiconductors (ICPS'96). World Scientific, Singapore, pp. 725-728, 23rd International Conference on the Physics of Semiconductors (ICPS'96), 21/07/96.

Far-infrared transient grating measurements of electron cooling in InAs and GaSb with sub-picosecond time resolution. / Planken, PCM; Pellemans, HPM; Wenckebach, WT.
Proceedings: "Physics of Semiconductors" 23rd International Conference on the Physics of Semiconductors (ICPS'96). ed. / M Scheffer; R Zimmermann. Singapore: World Scientific, 1996. p. 725-728.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

TY - GEN

T1 - Far-infrared transient grating measurements of electron cooling in InAs and GaSb with sub-picosecond time resolution

AU - Planken, PCM

AU - Pellemans, HPM

AU - Wenckebach, WT

PY - 1996

Y1 - 1996

M3 - Conference contribution

SP - 725

EP - 728

BT - Proceedings: "Physics of Semiconductors" 23rd International Conference on the Physics of Semiconductors (ICPS'96)

A2 - Scheffer, M

A2 - Zimmermann, R

PB - World Scientific

CY - Singapore

T2 - 23rd International Conference on the Physics of Semiconductors (ICPS'96)

Y2 - 21 July 1996 through 26 July 1996

ER -