Far-infrared transient grating measurements of electron cooling in InAs and GaSb with sub-picosecond time resolution

PCM Planken, HPM Pellemans, WT Wenckebach

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

    Original languageUndefined/Unknown
    Title of host publicationProceedings: "Physics of Semiconductors" 23rd International Conference on the Physics of Semiconductors (ICPS'96)
    EditorsM Scheffer, R Zimmermann
    Place of PublicationSingapore
    PublisherWorld Scientific
    Pages725-728
    Number of pages4
    Publication statusPublished - 1996
    Event23rd International Conference on the Physics of Semiconductors (ICPS'96) - Singapore
    Duration: 21 Jul 199626 Jul 1996

    Publication series

    Name
    PublisherWorld Scientific

    Conference

    Conference23rd International Conference on the Physics of Semiconductors (ICPS'96)
    Period21/07/9626/07/96

    Cite this

    Planken, PCM., Pellemans, HPM., & Wenckebach, WT. (1996). Far-infrared transient grating measurements of electron cooling in InAs and GaSb with sub-picosecond time resolution. In M. Scheffer, & R. Zimmermann (Eds.), Proceedings: "Physics of Semiconductors" 23rd International Conference on the Physics of Semiconductors (ICPS'96) (pp. 725-728). World Scientific.