Fast and reliable pre-approach for scanning probe microscopes based on tip-sample capacitance

J. M. de Voogd, M. A. van Spronsen, F. E. Kalff, B. Bryant, O. Ostojić, A. M.J. den Haan, I.M.N. Groot, T. H. Oosterkamp, A. F. Otte, M. J. Rost

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