@inproceedings{242351b846b4409e89b5f3bb78d4ae03,
title = "Fast preparation of ultrathin FIB lamellas for MEMs-based in situ TEM experiments",
abstract = "The preparation of thin lamellas by focused ion beam (FIB) for MEMS-based in situ TEM experiments is time consuming. Typically, the lamellas are of ~5μm*10μm and have a thickness less than 100nm. Here we demonstrate a fast lamellas{\textquoteright} preparation method using special fast cutting by FIB of samples prepared by conventional TEM sample preparation by argon ion milling or electrochemical polishing methods. This method has been applied successfully on various materials, such as ductile metallic alloy Ti68Ta27Al5, brittle ceramics K0.5Na0.5NbO3-6%LiNbO3 and semiconductor Si. The thickness of the lamellas depends on the original TEM sample.",
keywords = "Fast lamellas preparation, Focused ion beam, HREM, In situ TEM heating experiments",
author = "Hui Wang and Shanggang Xiao and Qiang Xu and Tao Zhang and Henny Zandbergen",
year = "2016",
doi = "10.4028/www.scientific.net/MSF.850.722",
language = "English",
isbn = "9783038357629",
volume = "850",
series = "Materials Science Forum",
publisher = "Trans Tech Publications",
pages = "722--727",
editor = "X. Liu and Y. Han and Y Wu and G. Li and F. Pan and R. Fan",
booktitle = "Methods of Design and Characterization of Materials, Research and Development of Technological Processes",
address = "Germany",
note = "Chinese Materials Congress on Methods of Design and Characterization of Materials, Research and Development of Technological Processes, 2015 ; Conference date: 10-07-2015 Through 14-07-2015",
}